- 전자장치 | Electronics > Laser Diode Test System
| Product |
AERODIODE Reliability test system for laser diode qualification in pulsed or CW regime -. From CW (Continuous Wave) down to less than 1 ns pulse width -. CW-LIV and Pulsed-LIV testing to avoid thermal effects -. 100% independent behavior of each laser diode -. Ideal for Butterfly or other fiber coupled packages (Mini-Butterfly, TOSA, TO-Can etc.) -. Embedded flash memory in each tray of 8 laser diodes -. Programming supervisory GUI with easy-to-use graphical interface -. Full laser protection with special protective window |
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Product Info
Reliability test system for laser diode qualification in pulsed or CW regime
Life-test and qualification test system for laser diode reliability evaluation in CW or pulsed regime down to 1 nanosecond. Up to 112 fully independent fibered devices are electrically, thermally and optically tested according to several user-programmed test scenario.
This laser diode reliability test system has been specially designed for the qualification and test of fiber-coupled devices with maximum of internal and external measurement flexibility. The laser diode optical power is measured independently from the BFMs or some external photodiodes with variable gain for a better precision. It allows for the independent and precise adjustment of the temperature of each laser diode package and each laser diode chip.
| Capacity | Up to 112 fibered devices |
|---|---|
| Diode chip temperature range | 10 - 55 °C |
| Diode package temperature range | 20 - 85 °C |
| Temperature stability (Typ) | < 1 mK |
| Control loop | ACC, APC, LIV |
| Current range (CW) | 1 - 2500 mA |
| Current range (Pulsed peak current) | 1 - 4000 mA |
| Pulse duration | 0.5 ns to CW |
| Compliance voltage (adjustable by user) | 1 - 24 V |
| Pulse overshoot (adjustable by user) | Down to 0 % |
| BFM / Ext photodiode measurement | Yes / Yes |
| Internal CW LIV / Pulsed LIV | Yes / Yes (provisional) |
| Current modulation | Exyernal or internal : sin /sqr / triang |
| Driver types | 100 % individual setpoints and test scenarios |
| Laser drive current setpoint resolution | Down to 25 µA |
| Laser drive current stability | < 0.1 mA |
| Internal embedded memory (per tray of 8 laser diodes) | 50 Go |
