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Beam'R2 – XY Scanning Slit Beam Profiler System


190 to 1150 nm, Silicon detector
650 to 1800 nm, InGaAs detector
1000 to 2300 or 2500 nm, InGaAs (extended) detector
Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
Port-powered USB 2.0; flexible 3 m cable, no power brick
0.1 µm sampling and resolution
Linear & log X-Y profiles, centroid
Profile zoom & slit width compensation
Economical and accurate
M² option – beam propagation analysis, divergence, focus
Application Laser printing & marking
Medical lasers
Diode laser systems
Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
Development, production, field service
CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
M² measurement with available M2DU stage
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Product Info

Single Plane XY Scanning Slit, 190 – 2500* nm

Port-powered USB 2.0


(주)유니오텍| 사업자 등록번호 : 314-86-49551| 대표 : 김진하
대전광역시 유성구 테크노4로 17 (관평동 684번지) 대덕비즈센터 B동 313호| 문의 : 042-933-9870
팩스 : 0303-0959-9870| 이메일 : sales@uniotech.kr
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